CLEANING A STRUCTURE SURFACE IN AN EUV CHAMBER

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20250085643A1
SERIAL NO

18962837

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Abstract

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In some general aspects, a surface of a structure within a chamber of an extreme ultraviolet (EUV) light source is cleaned using a method. The method includes generating a plasma state of a material that is present at a location adjacent to a non-electrically conductive body that is within the chamber. The generation of the plasma state of the material includes electromagnetically inducing an electric current at the location adjacent the non-electrically conductive body to thereby transform the material that is adjacent the non-electrically conductive body from a first state into the plasma state. The plasma state of the material includes plasma particles, at least some of which are free radicals of the material. The method also includes enabling the plasma particles to pass over the structure surface to remove debris from the structure surface without removing the structure from the chamber of the EUV light source.

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Patent Owner(s)

Patent OwnerAddress
ASML NETHERLANDS B V5500 AH VELDHOVEN

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Baek, Jonghoon Saratoga, US 30 1674
Dziomkina, Nina Vladimirovna San Diego, US 43 288
Evans, David Robert Poway, US 7 31
LaForge, Andrew David Poway, US 15 27
Ma, Yue Escondido, US 269 3729
Stewart,, IV John Tom Escondido, US 10 48
Van, Heijnsbergen Deniz San Diego, US 3 6
Xia, Chunguang San Diego, US 30 555

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