Importance

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Abstract

An object is to provide a technique which enables an outer portion to identify a type of an error state from an identification signal in an early state. A semiconductor element drive device includes a plurality of error state detection circuits generating an error signal corresponding to an error state, an error state identification signal generation circuit generating an error state identification signal having a different waveform for each type of the error state and having a pulse width smaller than each error signal based on the plurality of error signals generated in the plurality of error state detection circuits, respectively, and an error state identification signal output terminal outputting an error state identification signal.

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First Claim