FAILURE DETECTION CIRCUIT, SEMICONDUCTOR DEVICE AND FAILURE DETECTION METHOD
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United States of America Patent
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Issued Date -
Mar 27, 2025
app pub date -
Jul 16, 2024
filing date -
Jul 16, 2024
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Abstract
A failure detection circuit is provided in the target circuit having a first circuit area for operating in synchronization with the first clock signal, a first detection circuit for outputting a first detection result obtained by transitioning the voltage level in synchronization with the first clock signal, the first clock signal a second detection circuit for outputting a second detection result obtained by transitioning the voltage level in synchronization with, and a first comparison circuit for outputting a first comparison result by comparing the first detection result and the second detection result. Accordingly, by the failure detection circuit, it is possible to detect the failure accurately.
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