SiC EPITAXIAL WAFER AND METHOD OF MANUFACTURING SiC EPITAXIAL WAFER

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United States of America

APP PUB NO 20250109526A1
SERIAL NO

18979953

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A SiC epitaxial wafer includes a SiC substrate and an epitaxial layer laminated on the SiC substrate, wherein the epitaxial layer contains an impurity element which determines the conductivity type of the epitaxial layer and boron which has a conductivity type different from the conductivity type of the impurity element, and the concentration of boron is less than 1.0×1014 cm−3 at any position in the plane of the epitaxial layer.

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Patent Owner(s)

Patent OwnerAddress
RESONAC CORPORATIONTOKYO 105-7325

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
TANAKA, Kensho Chichibu-shi, JP 5 2
UMETA, Yoshikazu Chichibu-shi, JP 16 4

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