RESIST COMPOSITION AND PATTERN FORMING PROCESS

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United States of America

APP PUB NO 20250116924A1
SERIAL NO

18903164

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Abstract

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A resist composition comprising a bisonium salt containing a divalent anion having a sulfonate anion structure having a fluorine atom or a trifluoromethyl group at α- or β-position and linked to an aromatic group having an iodine atom or a bromine atom and a sulfonimide anion structure or a sulfonamide anion structure bonded to the aromatic group having an iodine atom or a bromine atom, via a linking group having 1 or more carbon atoms, and an onium cation.

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Patent Owner(s)

Patent OwnerAddress
SHIN-ETSU CHEMICAL CO LTDCHIYODA-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujiwara, Takayuki Joetsu-shi, JP 155 990
Hatakeyama, Jun Joetsu-shi, JP 692 7607

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