Linear flaw detector
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United States of America Patent
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-
Jan 15, 1980
Issued Date -
N/A
app pub date -
Oct 2, 1978
filing date -
Dec 8, 1975
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A linear flaw detector for coated surfaces. An incident beam is provided and sensed above and below the theoretical specular angle. Where a flaw occurs, the reflected signal changes in intensity. By sensing above and below the specular angle, the signal corresponding to the flaw is accented in reference to the signals from the background. The signal corresponding to the flaw may then be separated from background noise and an output provided.
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Cited Art Landscape
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