Method for etching silicon and a residue and oxidation resistant etchant therefor

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United States of America Patent

PATENT NO 4187140
SERIAL NO

05950340

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Abstract

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There are provided quaternary etchants comprising ethylenediamine, pyrocatechol, water and a diazine as catalyst for the etching of polycrystalline or single crystal silicon over a wide temperature and etch rate range. The etchants provide residue free dissolution, and have etch rates which are essentially unchanged when exposed to oxygen. The etch rate of the etchants can be modulated by the change in concentrations of water and/or pyrocatechol. There is also provided a method for etching polycrystalline or single crystal silicon using the etchants of this invention.

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Patent Owner(s)

  • INTERNATIONAL BUSINESS MACHINES CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Berkenblit, Melvin Yorktown Heights, NY 3 59
Reisman, Arnold Yorktown Heights, NY 27 1108

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