Opthalmoscope examination pattern having light transmissive fixation point
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United States of America Patent
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-
Apr 8, 1980
Issued Date -
N/A
app pub date -
May 26, 1978
filing date -
Jun 20, 1974
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present application discloses an examination pattern for use in conjunction with ophthalmoscopes which provides a light transmissive opening at the pattern center to act as a reference point in the examination of the eye.
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