Measuring system
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United States of America Patent
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Dec 16, 1980
Grant Date -
N/A
app pub date -
Feb 16, 1979
filing date -
Feb 16, 1979
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
There is provided a method for measuring a parameter whose value is calculable as an integral with time of a function of at least one variable so as to make possible the use of a microprocessor when measurements of such variables are desired. The variable is sampled periodically at a frequency asynchronous with the wave form which the variable follows and then there is periodically calculated the value of the function by summing the values for the function determined by the samples taken during the time between the calculations, thus determining the desired integral.
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