Apparatus and method for integrated circuit test analysis
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United States of America Patent
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Dec 30, 1980
Grant Date -
N/A
app pub date -
Jan 26, 1979
filing date -
Jan 26, 1979
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An integrated circuit test analysis apparatus for visually interpreting voltage changes of active circuit components uses the electro-optic display effect of circuit electric field upon the liquid crystal layer which is applied over the circuit being tested. The normal state duty cycles in a repeating sequence of test states of the integrated circuit is modified by causing the integrated circuit to pause or maintain a particular state at one or more specific time periods for a predetermined time interval to permit the display to be recorded.
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