Plasma etching process

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United States of America Patent

PATENT NO 4255230
SERIAL NO

06123829

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In an improved process for the etching of polysilicon substrates, a polysilicon substrate is exposed to plasmas of carbon tetrachloride, chlorinated gas, fluorinated gas or a gas capable of generating both chlorinated and fluorinated plasma species. The combination of a chlorinated and fluorinated etching species substantially reduces undercutting of polysilicon substrates. Improved uniformity of polysilicon etching is also achieved.

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Patent Owner(s)

  • EATON CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Zajac, John Santa Clara, CA 58 1042

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