Rapid scan spectral analysis system utilizing higher order spectral reflections of holographic diffraction gratings

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United States of America Patent

PATENT NO 4264205
SERIAL NO

05940360

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An improved optical system is disclosed for rapid, accurate spectral analysis of the reflectivity or transmissivity of samples. A concave holographic diffraction grating oscillated at high speed is utilized to provide a rapid scanning of monochromatic light through a spectrum of wavelengths. The grating is positively driven at very high speed. The rapid scan by the grating enables the reduction of noise error by averaging over a large number of cycles. It also reduces the measurement time and thus prevents sample heating by excessive exposure to light energy. A filter wheel having opaque segments is rotated in the optical path and is synchronous with the grating. The filter wheel is divided into two arcuate segments separated by the opaque segments arranged approximately 180 degrees apart. One arcuate segment of the wheel transmits only first order light. The other arcuate segment transmits only second order light. Separate photodetectors are employed during infrared analysis of samples for detecting first order and second order wavelength transmissions and an electronic decoder apparatus is utilized for switching between detectors.

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Patent Owner(s)

  • NIR INSTRUMENTS COMPANY, A CORP. OF DEL.;NIRSYSTEMS INCORPORATED;NEOTEC CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Landa, Isaac J Wheaton, MD 5 358

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