Method and apparatus for testing analog-to-digital and digital-to-analog code converters
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United States of America Patent
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-
May 5, 1981
Grant Date -
N/A
app pub date -
Nov 20, 1978
filing date -
Nov 20, 1978
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An apparatus and method for testing for faults in an analog-to-digital (A/D) section and a digital-to-analog (D/A) section of a code converter in a digital time division, multiplex telecommunications system are disclosed. The A/D section is tested by connecting a digital test pattern via the switching network to the D/A section and monitoring for faults by comparing the resulting output to a reference value. The A/D section is tested by interconnecting the A/D section to be tested between a first previously tested D/A section and a second previously tested D/A section and then connecting the digital test pattern to the first D/A section while monitoring the output of the second D/A section for faults.
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