Universal analog and digital tester
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 2, 1981
Grant Date -
N/A
app pub date -
Mar 23, 1979
filing date -
Mar 23, 1979
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Method and apparatus for comparison-type testing of electronic devices which generate analog waveform output signals. A reference unit output signal and an output signal of a unit under test are paired and selectively and synchronously compared in response to a common input signal. The comparison is performed by means of subtraction producing an error signal, which error signal is compared against a limit window. The limit window may have fixed or preferably programmable amplitude limits whereby a digital decision signal is generated whenever the limits are exceeded.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully