Process and equipment for the thermal analysis of materials
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United States of America Patent
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-
Dec 8, 1981
Issued Date -
N/A
app pub date -
Nov 5, 1979
filing date -
Apr 14, 1977
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and an apparatus for the differential thermal analysis of materials includes heating a first sample to be investigated and a reference sample by radiation heat transfer from respective separated radiation sources, controlling both sources according to a predetermined temperature program for the samples, interposing an element that partly transmits radiation between each of the samples and their associated sources, sensing the temperature difference between the elements, controlling one of the radiation sources in response to the temperature difference to equalize the temperature of the elements and measuring the temperature difference between the samples during the temperature program.
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