Method and apparatus for testing electronic devices
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United States of America Patent
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Dec 22, 1981
Grant Date -
N/A
app pub date -
Jul 16, 1979
filing date -
Jul 16, 1979
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A surge protector is tested by injecting a current spike with an exponentially decaying waveshape (12) through the surge protector. The current is generated by connecting a voltage source (16) to the surge protector and controlling the current through the surge protector by a Darlington array amplifier (20) connected between the surge protector and ground. The Darlington array amplifier (20) is in turn controlled by first generating a reference pulse having a voltage waveform corresponding to the desired current waveform and comparing this reference voltage with a voltage feedback from the Darlington array amplifier (20) to in turn generate an error voltage which is coupled into the amplifier (20). Additionally, differential amplifier circuits (44 and 46) monitor the voltage impressed on the amplifier (20) and reduce the input voltage to the amplifier (20) significantly if the voltage impressed on the amplifier (20) is greater than a predetermined fraction of the voltage source (16).
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