Importance

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Abstract

A transfer assembly interposable between a storage tube containing semiconductor devices and a processing station therefor, the assembly effecting a controlled electrostatic discharge of each device taken from the tube to prevent a destructive discharge thereof. The transfer assembly includes an insulating track adapted to receive semiconductor devices from the storage tube, each lead of the device received on the track being engaged by a pair of Kelvin contacts, one of which is connected by a normally-open high impedance relay to an input of a test system for the device, the other being connected to ground through the high-impedance drain and source channel of a field effect transistor. Applied to the gate of the transistor is a ramp voltage causing the channel impedance to diminish at a slew rate producing a gradual and safe bleed of the electrostatic charge carried on the engaged lead. At the conclusion of the discharge cycle, the relay is actuated to connect the lead to the test system.

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First Claim