Interferometer apparatus for the direct measurement of wavelength and frequency
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United States of America Patent
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Mar 16, 1982
Grant Date -
N/A
app pub date -
Feb 25, 1980
filing date -
Feb 25, 1980
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A dual beam interferometer in which the motion of a mirror produces optical path variation resulting in fringes at photodetectors provides direct, selectable measurement of wavelength and frequency of an input laser beam with high accuracy and over a large frequency and wavelength range without the need for correction due to differences in the index of refraction over the range.
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