Apparatus for measuring a radiation affecting parameter of a film or coating

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4320967
SERIAL NO

06129810

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

The apparatus employs two or more beams of radiation of different spectral composition which are transmitted through a sample and received by a detector which provides signals for computing the required parameter by ratio measurements. The beams are directed to a sample zone where a part is transmitted through, and a part is reflected by a sample. The invention provides diffusing means to receive the transmitted and reflected parts and pass the same onto a radiation responsive detector. The diffusing means may be a ground glass plate or a member made of fused alumina. A concave mirror may be used to reflect the reflected part back through the sample zone which is close to or at the center of curvature of the mirror. A beamsplitter may also be used so that the beams are directed substantially normal to a plane in the sample zone.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
INFRA-RED ENGINEERING LTDNot Provided

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Edgar, Roger F Maldon, GB2 5 101

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation