Method and apparatus for determining the low temperature characteristics of materials
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 4, 1982
Grant Date -
N/A
app pub date -
Feb 29, 1980
filing date -
Feb 29, 1980
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and apparatus for determining the low temperature characteristics of materials measures the resistivity of a sample material and the resistivity of a comparision material and plots the ratio of the resistivity of the comparision material to the resistivity of the sample material versus the temperature of the sample material. In addition, the method and apparatus measures the temperature of the sample and the temperature of a reference material and plots the difference there between as a function of the temperature of the reference material. The method and apparatus is usable in monitoring and/or controlling lyophilization appartus in order to increase the efficiency of the freeze drying process, that is, increasing product yield while reducing processing time.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully