Testing apparatus
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United States of America Patent
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Jun 8, 1982
Grant Date -
N/A
app pub date -
Dec 14, 1979
filing date -
Dec 14, 1978
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of deriving the value of any one of the commonly used parameters for characterizing surfaces in surface measurement technology includes the steps of computing the autocorrelation function of a signal representing the surface, and selectively utilizing values of this autocorrelation function together with the value of the sampling interval used in generating the autocorrelation function, to derive the desired parameter values. This method considerably simplifies the information on a surface which is required, and enables micro-processor techniques to be used in the computation of the parameters.
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