Shape testing apparatus

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4343553
SERIAL NO

06181768

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A shape detecting apparatus comprises a slit projecting means for projecting a slit image on a three-dimensional object such as a soldered area, a positioning means for positioning the three-dimensional object relative to the slit projecting means, an image pickup means for two-dimensionally scanning the slit image projected by the slit projecting means to pickup the image, a light segment extracting circuit including a center position extracting means for extracting a mean position (Z.sub.1 +Z.sub.2)/2 of two position signals Z.sub.1 and Z.sub.2 at which a video signal derived by transversely scanning the slit image by the image pickup means corresponds, to a first higher reference V.sub.1 when the video signal exceeds the first higher reference V.sub.1, a maximum value position extracting circuit for extracting a position Z corresponding to a maximum value of the video signal when the maximum value of the video signal is no higher than the first higher reference V.sub.1 and exceeds a second lower reference V.sub.2 and an erasing means for erasing the position signal when the maximum value of the video signal is no higher than the second lower reference V.sub.2, and a detecting means for detecting undersoldered condition and oversoldered condition by analyzing and evaluating the three-dimensional object based on the light segment position information derived from the light segment extracting circuit.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTD6-6 MARUNOUCHI 1-CHOME CHIYODA-KU TOKYO 1008280 ?1008280

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akiyama, Nobuyuki Yokohama, JP 38 1043
Makihira, Hiroshi Yokohama, JP 18 653
Nakagawa, Yasuo Yokohama, JP 44 1275
Oshida, Yoshitada Fujisawa, JP 57 1031

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