Method and apparatus for measuring the content or quantity of a given element by means of X-ray radiation
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 10, 1982
Issued Date -
N/A
app pub date -
Dec 9, 1980
filing date -
Jun 21, 1978
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method and apparatus for measuring the content of an element by means of X-ray-radiation. Electrons from the cathode of a low-power X-ray tube are directed onto one side of the anode of said tube, said anode comprising a thin layer of anode material on a beryllium plate. The electrons excite primary X-ray-radiation in the anode material, including the characteristic X-ray lines. The radiation passes out through the opposite side of the anode as transmission radiation and is directed onto the element to be measured, whereupon fluorescense occurs, said fluorescense being caused by the characteristic lines. The fluorescense lines of the substance are then isolated by means of a balanced filter.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully