Universal test fixture employing interchangeable wired personalizers
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Sep 28, 1982
Grant Date -
N/A
app pub date -
May 24, 1979
filing date -
May 24, 1979
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A universe of probes is contained within a platen in a spaced-apart, substantially parallel relationship with one another with their tips pointing in the same direction. Each probe is free to move longitudinally between an advanced or test position and a retracted position. The platen nests into a wired personalizer having probe selector posts upstanding therein in a pattern corresponding to the pattern of test points on a circuit board to be tested. These posts serve to push up or advance the probes needed to test a particular type of circuit board. The posts are conductive and each is individually connected to the test system. The circuit board to be tested rests on a special deformable gasket so that its test points are suspended over and aligned with the advanced test probes. When the fixture is evacuated, the circuit board to be tested is drawn downwardly so that the test points on the board make electrical contact with the tips of the advanced probes.
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