Barcode width measurement system

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United States of America Patent

PATENT NO 4411016
SERIAL NO

06269130

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A single columnar array of scanning diodes is used to make width measurements of bar codes in order to read the contents thereof. The bar code is scanned utilizing a scanning procedure which directs the columnar array along the bar code such that the photo elements on the scanning array lie along an axis parallel to a line drawn horizontally through the bar codes. The same scanning array may be used to read alphanumeric characters scanning along an axis perpendicular to the columnar array.

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Patent Owner(s)

Patent OwnerAddress
BANTEC INC A CORP OF DELAWARE4435 SPRING VALLEY ROAD DALLAS TX 75244

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wakeland, Charles A Midlothian, TX 1 41

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