Apparatus and methods for the shunt calibration of semiconductor strain gage bridges
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United States of America Patent
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Nov 15, 1983
Grant Date -
N/A
app pub date -
Feb 16, 1982
filing date -
Feb 16, 1982
priority date (Note) -
Expired
status (Latency Note)
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Abstract
There is disclosed an apparatus and a technique for shunt calibration of a Wheatstone bridge array independent of temperature. The structure involves a side completion half bridge array which has two temperature sensitive resistors as semiconductor strain gages forming one arm of the bridge and two temperature insensitive resistors forming the other arm of the bridge. An input voltage is applied to two opposite terminals of the bridge via equal span resistors and an output is taken between the common terminals of each of the bridge arms. A calibration resistor is positioned to shunt a span resistor and a temperature insensitive resistor to provide a calibrated output voltage of a magnitude independent of temperature.
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