Importance

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Abstract

A test contactor assembly for integrated circuit (IC) electronic devices and the like has at least one row of flexible contacts that are each secured at a lower end to a base. A conductive plate is also secured to the base and extends in a generlly parallel, closely spaced relationship to each row of contacts. The dimensions of the plate and its spacing from the associated contacts produce a distributed capacitance with respect to each contact in the row such that a fast-rising test signal launched in a contact encounters a generally 'characteristic' or purely resistive impedance that is frequency independent. A flexible insulating material is preferably located between the plate and its associated row of contacts to maintain the desired spacing as the plate and the contacts are flexed into electrical connection with associated pins of the device. For use with dual-in-line packaged (DIP) IC'S and Kelvin contacts, a pair of 'inner' plates closest to the device carry pin contacts that can supply a large test current surge to the device. The inner plates are preferably connected to one another through a small capacitor and substantially reduce ground noise generated by current surges.

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First Claim