Method for deep level transient spectroscopy scanning and apparatus for carrying out the method
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United States of America Patent
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Mar 13, 1984
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N/A
app pub date -
Jun 3, 1981
filing date -
Jun 7, 1980
priority date (Note) -
Expired
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Abstract
A Deep Level Transient Spectroscopy (DLTS) method in which a high frequency measuring signal is applied continuously on a semiconductor junction, and exciting pulses are generated which are coupled through fast semiconductor switching elements to the junction to alternatively bias the junction in reverse and forward (or slightly reverse) directions. The high frequency measuring signal passed through the junction is evaluated by means of a lock-in amplifier phase-locked with a constant phase angle, independent of the repetition rate of the exciting pulses. The evaluation circuits of the apparatus including the lock-in amplifier are controlled by switching elements driven by control signals generated from the exciting pulses.
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