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Abstract

A circuit adapted for use in a high speed computer controlled digital in-circuit tester for obtaining high pulse fidelity at each electrical node of a circuit under test is provided. High pulse fidelity is obtained by minimizing the current in the power supply and digital test signal current loops for the components of the circuit under test. The tester includes a plurality of programmed memory digital test-signal generators responsive to the computer for generating and supplying to the nodes of the circuit under test a complex sequence of digital logic signals. The circuit also includes a plurality of distributed programmable power sources, each power source associated with at least one of said test signal generators, for generating the power supply voltages for the components. The power supply voltages for the components under test are obtained from the programmable power sources associated with the test signal generators involved in generating and supplying the test signals to those components, thereby localizing the component power supply current loops and the driving digital test signal current loops.

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First Claim