Process for the selective analysis of individual trace-like components in gases and liquid
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United States of America Patent
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Aug 28, 1984
Grant Date -
N/A
app pub date -
Jun 14, 1982
filing date -
Jun 27, 1981
priority date (Note) -
Expired
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Abstract
The analysis comprises first enriching the component to be determined (target component) by contacting an non porous solid surface with the gas or the liquid to be investigated and depositing the target component from the gaseous or liquid phase onto the solid surface in the range of a monolayer preferably within the first monolayer. The deposition is effected by absorbing the target component either directly or in the form of a derivative product, which can then be detected by introducing the solid surface with the enriched target component into a mass spectrometer. Surface sensitive mass analyzers, such as secondary ion mass spectrometers or laser activated mass analyzers, have been proven successful.
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