Method and apparatus for gas phase treating substrates

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United States of America Patent

PATENT NO 4486461
SERIAL NO

06476551

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Abstract

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Despite the short lifetime of excited plasma gas, a very large number of wafers can be uniformly gas phase treated in the plasma state by using a single high frequency power supply coil or capacitor, not only for exciting reaction gas passing near the wafers in a reaction tube but also for heating radiators, surrounding the substrates, which heat the wafers.

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Patent Owner(s)

  • FUJITSU LIMITED

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ito, Takashi Kawasaki, JP 577 7464
Kato, Ichiro Machida, JP 41 704

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