Multiple measurement noise reducing system using artifact edge identification and selective signal processing
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United States of America Patent
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Feb 12, 1985
Grant Date -
N/A
app pub date -
Feb 22, 1983
filing date -
Feb 22, 1983
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Disclosed is a multiple measurement multiple energy X-ray imaging system in which a plurality of measurements are processed to provide a first image signal representing a desired parameter of an object and in which the plurality of measurements are processed to provide a second processed image signal having greater signal-to-noise ratio than the first processed image signal but in which extraneous artifacts may be introduced into the signal. The spatial location of edges of the extraneous artifacts are determined. The first processed image signal and the second processed image signal are combined to provide an improved image signal except at the spatial locations of the extraneous artifacts where the first processed image signal is used for the image signal thereby eliminating the extraneous artifact from the displayed image.
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