Method of manufacturing capacitance-type material level indicator probe

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United States of America Patent

PATENT NO 4499640
SERIAL NO

06411524

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A system and probe for indicating the level of material in a vessel as a function of material capacitance comprising a resonant circuit including a capacitance probe adapted to be disposed in a vessel so as to be responsive to variations in capacitance as a function of material level. An rf oscillator has an output coupled to the resonant circuit and to a phase detector for detecting variations in phase angle as a function of probe capacitance. Level detection circuitry is responsive to an output of the phase detector and to a reference signal indicative of a predetermined level of material for indicating material level as a function of a difference between capacitance at the probe and the reference signal. In the preferred embodiments of the invention disclosed, an automatic calibration circuit adjusts the resonance characteristics of the parallel resonant circuit of the reference signal indicative of a predetermined reference material level.

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Patent Owner(s)

Patent OwnerAddress
BINDICATOR COMPANY LLCA LIMITED LIABILITY COMPANY OF DELAWARE 150 VENTURE BOULEVARD SPARTANBURG SC 29305

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Brenton, Ronald G Marysville, MI 2 33
Runck, Robin B Sherman Oaks, CA 2 46

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