In-circuit digital tester for testing microprocessor boards
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United States of America Patent
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Feb 19, 1985
Issued Date -
N/A
app pub date -
May 19, 1982
filing date -
Jun 17, 1980
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A circuit for use in an in-circuit digital tester for generating data bus and control line test signals to test the electrical performance properties of components in a circuit under test is disclosed. Certain components in a circuit under test, such as microprocessors, are bus oriented devices which perform their functions in predetermined cycles. These cycles have been divided up into control sequences of control signals. Sequences of data signals are also generated. Each test pin in the bed of nails test fixture has a digital test signal generator associated therewith. The present invention operates to program each test signal generator with digital test signal generating data to produce the control and data sequences required to test a device under test during a test cycle. These predetermined sequences in control and data sequences are specified by a sequence in starting addresses of the programmable memory locations containing the selected control and data sequences to be generated.
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