Defect-remediable semiconductor integrated circuit memory and spare substitution method in the same

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United States of America Patent

PATENT NO 4514830
SERIAL NO

06344974

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Abstract

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An LSI memory comprises a memory array including usual memory cells arranged in a matrix form, usual address transistors for selecting usual lines connected to the columns or rows of the memory array, address lines for controlling the usual address transistors, spare memory cells provided in the memory array, a spare line connected to the spare memory cells, spare address transistors connected between the address lines and the spare lines, and nonvolatile memory elements connected between the sources of the spare address transistors and the ground. By putting any one of the nonvolatile memory elements into the written state, any one of the spare address transistors are conditioned into an active state so that the spare line can be substituted for a defective usual line.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTD A CORP OF JAPAN6 KANDA SURUGADAI 4-CHOME CHIYODA-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hagiwara, Takaaki Kodaira, JP 34 447
Horiuchi, Masatada Koganei, JP 35 711
Kondo, Ryuji Kodaira, JP 31 521
Minami, Shinichi Hachioji, JP 66 599
Yatsuda, Yuji Kanagawa, JP 42 465

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