Testable time delay
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United States of America Patent
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May 21, 1985
Grant Date -
N/A
app pub date -
Jul 27, 1982
filing date -
Jul 27, 1982
priority date (Note) -
Expired
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Abstract
A testable time delay apparatus includes means for testing component operation during any stage of system function and means for continuously monitoring and testing component functions. The device is particularly useful in critical process control applications such as in a nuclear reactor control system.
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