US Patent No: 4,520,313

Number of patents in Portfolio can not be more than 2000

Semiconductor testing and apparatus therefor

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Abstract

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A semiconductor die is positioned and examined by means of scanning certain strategic regions which border or overlap said die. The video which results from the scanning is digitized. For example, black is represented by an '0' and white is represented by a '1'. The results may be compared with an acceptable pattern to determine a good die and statistically analyzed to see if the data represents the die or surrounding street.

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Patent Owner(s)

Patent OwnerAddressTotal Patents
ASM AMERICA, INC.PHOENIX, AZ267

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Allred, Jr Laurence L Chandler, AZ 2 5
Lange, Bradley N Chandler, AZ 3 54

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Patent Citation Ranking

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Patent Info (Count) # Cites Year
 
KABUSHIKI KAISHA TOSHIBA (1)
* 5,389,990 Method for measuring DC current/voltage characteristic of semiconductor device 6 1992
 
NORTHWEST TECHNOLOGY GROUP, 6700 S.W. 105TH AVENUE, STE. 207, BEAVERTON, OR 97005 A CORP. OF OREGON (1)
* 5,086,477 Automated system for extracting design and layout information from an integrated circuit 116 1990
* Cited By Examiner