US Patent No: 4,520,313

Number of patents in Portfolio can not be more than 2000

Semiconductor testing and apparatus therefor

Stats

See full text
ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A semiconductor die is positioned and examined by means of scanning certain strategic regions which border or overlap said die. The video which results from the scanning is digitized. For example, black is represented by an "0" and white is represented by a "1". The results may be compared with an acceptable pattern to determine a good die and statistically analyzed to see if the data represents the die or surrounding street.

Loading the Abstract Image... loading....

First Claim

See full text

all claims..

Related Publications

Loading Related Publications... loading....

Patent Owner(s)

Patent OwnerAddressTotal Patents
ASM AMERICA, INC.PHOENIX, AZ321

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Allred, Jr Laurence L Chandler, AZ 2 5
Lange, Bradley N Chandler, AZ 3 54

Cited Art Landscape

Patent Info (Count) # Cites Year
 
ADVANTEST CORPORATION (2)
4,220,854 Method for the contactless measurement of the potential waveform in an electronic component and apparatus for implementing the method 27 1979
4,277,679 Apparatus and method for contact-free potential measurements of an electronic composition 33 1979
 
RCA Corporation (1)
4,205,265 Laser beam apparatus and method for analyzing solar cells 10 1978

Patent Citation Ranking

Forward Cite Landscape

Patent Info (Count) # Cites Year
 
KABUSHIKI KAISHA TOSHIBA (1)
5,389,990 Method for measuring DC current/voltage characteristic of semiconductor device 6 1992
 
NORTHWEST TECHNOLOGY GROUP, 6700 S.W. 105TH AVENUE, STE. 207, BEAVERTON, OR 97005 A CORP. OF OREGON (1)
5,086,477 Automated system for extracting design and layout information from an integrated circuit 105 1990