US Patent No: 4,520,313
Number of patents in Portfolio can not be more than 2000
Semiconductor testing and apparatus therefor
Stats
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May 28, 1985
Issued date -
Mar 30, 1982
filing date -
06/363,641
serial no -
Expired
status
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Abstract
A semiconductor die is positioned and examined by means of scanning certain strategic regions which border or overlap said die. The video which results from the scanning is digitized. For example, black is represented by an "0" and white is represented by a "1". The results may be compared with an acceptable pattern to determine a good die and statistically analyzed to see if the data represents the die or surrounding street.
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First Claim
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International Classification(s)
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Cited Art
| Patent Info | (Count) | # Cites | Year |
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| 4,220,854 Method for the contactless measurement of the potential waveform in an electronic component and apparatus for implementing the method | 27 | 1979 | |
| 4,277,679 Apparatus and method for contact-free potential measurements of an electronic composition | 33 | 1979 | |
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| 4,205,265 Laser beam apparatus and method for analyzing solar cells | 10 | 1978 | |