Importance

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Abstract

A memory controller includes a partial defective bulk random access memory having a number of word locations constructed from a plurality of bit wide chips containing a predefined small number of random row or column faults. System columns of chips are organized into a plurality of groups, each group providing a different predetermined portion of the number of word locations. A defect-free memory system having substantially less capacity is similarly organized. Both memories couple to a static memory which stores column addresses associated with good memory locations and slice bit codes specifying the operational status of corresponding bit groups of word locations within both memories. During operation, read/write control circuits read and write valid words from group of bit locations from locations of both memories specified by slice bit codes.

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First Claim