Radiation scatter apparatus and method
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United States of America Patent
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Jun 25, 1985
Grant Date -
N/A
app pub date -
Mar 22, 1983
filing date -
Mar 22, 1983
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A radiation scatter gauge includes multiple detector locations for developing separate and independent sets of data from which multiple physical characteristics of a thin material and underlying substrate may be determined. In an illustrated embodiment, the apparatus and method of the invention are directed to determining characteristics of resurfaced pavement by nondestructive testing. More particularly, the density and thickness of a thin asphalt overlay and the density of the underlying pavement may be determined.
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Cited Art Landscape
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