Method and device for analyzing a very high frequency radiation beam of electromagnetic waves
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United States of America Patent
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Jul 23, 1985
Grant Date -
N/A
app pub date -
May 17, 1982
filing date -
May 18, 1981
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The invention refers to the analysis of a very high frequency radiation beam of electromagnetic waves. According to the invention, a network of conductor wires is placed in the path of a beam to be analyzed, the wires being interrupted at intervals by switches. One controls the conducting state of a diode and one blocks the others and one makes the position of the diode vary electronically and sequentially in the conducting state. The return signal received on a sensor R is used by detecting the significant characteristics of that return according to the position of the diodes in the conducting state.
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