Method of fabricating semiconductor device by dry process utilizing photochemical reaction, and apparatus therefor

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United States of America Patent

PATENT NO 4540466
SERIAL NO

06604118

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Abstract

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Photochemical technique is applied, in a unique manner, to the so-called dry process intended for etching a substrate or for deposition thereon in the presence of a gas supplied into a chamber containing the substrate. The interior of this chamber is so structured as to produce a higher pressure gas region and a lower pressure gas region. A beam of light rays is caused to impinge onto the former region to activate the particles of gas. The resulting gas containing the activated particles is fed onto the substrate placed in the latter region as carried through at least one passageway provided between the two regions by the flow of gas caused due to the difference in pressure of gas in these two regions. Thus, the aimed etching or deposition is carried out without damaging the surface of the substrate which would occur by the collision of the otherwise heavily energized particles against the surface of the substrate.

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Patent Owner(s)

Patent OwnerAddress
SEMICONDUCTOR RESEARCH FOUNDATION KAWAUCHI SENDAI-SHI MIYAGI-KEN 980 JAPANNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Nishizawa, Jun-ichi Sendai, JP 152 3265

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