Static memory having load polysilicon resistors formed over driver FET drains

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United States of America Patent

PATENT NO 4541006
SERIAL NO

06571948

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A semiconductor device having a semiconductor substrate, wherein first and second insulating gate FET transistor connected respectively in series with first and second polycrystalline silicon layers acting as loads of first and second inverters are formed. The first polycrystalline silicon layer is provided above the drain of the first insulation gate FET transistor, and the second polycrystalline silicon layer is provided above the drain of the second insulation gate FET transistor.

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Patent Owner(s)

  • TOKYO SHIBAURA DENKI KABUSHIKI KAISHA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ariizumi, Shoji Tokyo, JP 28 411
Segawa, Makoto Yokohama, JP 43 421

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