Bit error rate measuring system

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United States of America Patent

PATENT NO 4566100
SERIAL NO

06486319

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Abstract

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A bit error rate of M-phase digital phase-modulated waves is measured by the steps comprising multiplying a received wave by M, phase-detecting the M-multiplied signal either directly or after frequency conversion, detecting errors by comparing the output level of the phase detection with a threshold, and counting the number of such errors. By employing above mentioned system, a bit error rate can be measured easily and accurately by a simple circuit structure.

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Patent Owner(s)

Patent OwnerAddress
KOKUSAI DENSHIN DENWA CO LTDSHINJUKU-KU 3-2 NISHISHINJUKU 2-CHOME TOKYO 163-8

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mizuno, Toshio Tanashi, JP 48 868
Ohkawa, Michihisa Tokyo, JP 5 112
Satoh, Gunkichi Yokohama, JP 3 139

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