Magnetic thickness gauge with adjustable probe

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United States of America Patent

PATENT NO 4567436
SERIAL NO

06341337

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A magnetic thickness gauge is disclosed wherein a balance arm is pivotably mounted in a housing with a spring providing a bias force to counteract a magnetic attraction of the balance arm toward a base of a coating to be measured. The balance arm is provided with a probe assembly including a magnet selectively positionable with respect to a spherical contact member of either a particular alloy of aluminum, iron and silicon or of tungsten carbide. The housing is preferably provided with supports at either end of the gauge. A balance arm is moved by way of a protrusion provided between the probe assembly and an adjustment knob for the spring with a scale and pointer indicating the thickness of the coating to be measured.

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Patent Owner(s)

Patent OwnerAddress
KOCH LINDAOTTAWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Koch, Frank Ogdensburg, NY 25 212

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