Easy-to-assemble capacitive probe for a high precision dimensional or distance gage

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 4568873
SERIAL NO

06475027

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ATTORNEY / AGENT: (SPONSORED)

Importance

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Abstract

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A capacitive probe assembly is comprised of an electrode subassembly and an electric circuit subassembly which can be readily connected to and disconnected from each other, both mechanically and electrically. The electrode subassembly comprises a measuring electrode and a guard electrode concentrically mounted within a tubular, electrically conductive housing while being insulated from each other and from the housing. The measuring and guard electrodes are exposed through one of the opposite open ends of the housing. Inserted in the housing through the other open end thereof, the circuit subassembly includes a circuit board, with measuring circuit elements mounted thereon, which is supported at one end by a plug and at another end by a disclike support. The plug is engaged in sockets in the measuring and guard electrodes for both mechanical and electrical connection of the measuring circuit board to the electrodes. The disclike support is retained in position within the housing by an end cap threadedly engaged in the said other end thereof. The housing is held at ground potential via the end cap, support, and conductive regions on the circuit board.

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First Claim

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Patent Owner(s)

  • IWASAKI ELECTRIC CO., LTD.

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ebara, Susumu Yokohama, JP 1 39
Odagiri, Shoji Tokyo, JP 1 39
Oyanagi, Yoshiki Fuchu, JP 1 39

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