Method of and apparatus for determining the position of a device relative to a reference
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United States of America Patent
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-
Apr 29, 1986
Grant Date -
N/A
app pub date -
Sep 12, 1984
filing date -
Sep 12, 1983
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of and an apparatus for determining the location or position of a surface element with respect to a reference which utilizes polychromatic light and with a holographic lens on the light focuses individual wavelengths thereof to respective focal points at one of which the surface element can be located. Light reflected from this surface element is then decomposed into the respective wavelengths and the intensities of these wavelengths are analyzed to determine the wavelength of greatest intensity, this being the wavelength whose focus corresponds to the focus of the surface element. The maximum intensity wavelength is used to determine the position of this focus and hence the position of the surface element with respect to a reference.
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