Apparatus and technique for monitoring photoelectron emission from surfaces
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United States of America Patent
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May 20, 1986
Grant Date -
N/A
app pub date -
May 30, 1984
filing date -
May 30, 1984
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An instrument for monitoring the surface characteristics of materials, whereby the surface is characterized by measurement of a current of photo-emitted electrons flowing from the surface to a collector on the instrument. The instrument directs ultra violet light against the surface being measured, and the photoelectrons emitted are characteristic of surface features such as oxide thickness, contamination, or fatigue. The current of electrons emitted from the surface is compared with previously established limits for surface quality to provide an acceptability test of the surface. The instrument is portable and does not require the use of a vacuum chamber.
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