Digital delay line tester
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 5, 1986
Grant Date -
N/A
app pub date -
Mar 12, 1985
filing date -
Mar 12, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The present invention describes a tester for determining the value of unknown delay lines in the nanosecond and subnanosecond range. The unknown delay line is introduced into the circuit loop of a free-running square wave oscillator previously calibrated to a predetermined frequency. A change in oscillator frequency occurs which is a measure of the value of the delay introduced into the loop by the unknown line. Such delay may be calculated as a function of the calibration and delay line-measured frequencies. The present tester provides measurements with increased accuracy and rapidity over previous measuring techniques.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully