Strain gauge measuring system
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 19, 1986
Grant Date -
N/A
app pub date -
Mar 6, 1985
filing date -
Mar 6, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
In the disclosed measuring system, the strain in opposingly stressed strain gauges is measured by alternately driving currents through the gauges, and measuring the resulting differences in the alternate currents. Two reversely poled transistors, or two FETs, form low impedance switches that alternately drive the currents through the gauges. A constant current source or a resistor provides a current path to both gauges.
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Cited Art Landscape
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