Height measuring system

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United States of America Patent

PATENT NO 4607525
SERIAL NO

06659210

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The invention of this disclosure is a profiling and testing system that uses an air probe to determine the contour of a wafer containing a plurality of dies so that an electrical sensor may automatically step from die to die and test the completed dies in the wafer.

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Patent Owner(s)

Patent OwnerAddress
MARTEK INC112 SOUTH ROCKFORD DRIVE SUITE 103 TEMPE AS 85281

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Roch, Jacques Mountain View, CA 1 21
Turner, Michael D San Jose, CA 85 1435

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